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Meng X, Sonn-Segev A, Schumacher A, Cole D, Young G, Thorpe S, Style RW, Dufresne ER, Kukura P.

Micromirror total internal reflection microscopy for high-performance single particle tracking at interfaces

7 Oct 2021

It's not all about interferometric scattering. Darkfield, especially with super-optimised micromirrors is really, really awesome. If you are tracking metal nanoparticles, we think this is the way to go. And maybe even for molecules...

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